Microscopy Analysis base to Leica confocal - To filament and wire samples

The support was developed during the work of the student Matheus Cerqueira de Jesus, with guidance from me and Dr. Professor Luis Rogerio de Oliveira Hein. Projects CNPq:168694/2018-2 and Fapesp:2019/14694-0. The mechanism was developed to standardize the roughness analysis of specimens such as filaments and wires. In it, the specimen is elevated (z) and functions as a square, holding it at the base of the Leica DCM-3D microscope.